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Author: Vicki J. Keast Publisher: ISBN: Category : Electron microscopy Languages : en Pages : 316
Book Description
Changes in the electronic structure, and hence bonding, at the grain boundaries in the presence of the segregants has been examined using the electron energy loss near edge structure (ELNES). In the embrittling systems of S-doped Ni and Sb-doped Cu, extra intensity in the ionization edge, just above the edge onset, was observed and is consistent with earlier measurements on Bi-doped Cu. No effect was seen with segregation of the non-embrittling Ag. The embrittling impurities are believed to reduce cohesion at the grain boundaries by changing the shape of the d-band, through bond rehybridization, and it is this change in shape that is observed as the extra intensity in the ELNES.
Author: Vicki J. Keast Publisher: ISBN: Category : Electron microscopy Languages : en Pages : 316
Book Description
Changes in the electronic structure, and hence bonding, at the grain boundaries in the presence of the segregants has been examined using the electron energy loss near edge structure (ELNES). In the embrittling systems of S-doped Ni and Sb-doped Cu, extra intensity in the ionization edge, just above the edge onset, was observed and is consistent with earlier measurements on Bi-doped Cu. No effect was seen with segregation of the non-embrittling Ag. The embrittling impurities are believed to reduce cohesion at the grain boundaries by changing the shape of the d-band, through bond rehybridization, and it is this change in shape that is observed as the extra intensity in the ELNES.
Author: Rodenburg Publisher: CRC Press ISBN: 9780750304412 Category : Technology & Engineering Languages : en Pages : 716
Book Description
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author: Pavel Lejcek Publisher: Springer Science & Business Media ISBN: 3642125050 Category : Technology & Engineering Languages : en Pages : 249
Book Description
Grain boundaries are important structural components of polycrystalline materials used in the vast majority of technical applications. Because grain boundaries form a continuous network throughout such materials, their properties may limit their practical use. One of the serious phenomena which evoke these limitations is the grain boundary segregation of impurities. It results in the loss of grain boundary cohesion and consequently, in brittle fracture of the materials. The current book deals with fundamentals of grain boundary segregation in metallic materials and its relationship to the grain boundary structure, classification and other materials properties.
Author: Valerie Randle Publisher: CRC Press ISBN: 1351409883 Category : Science Languages : en Pages : 182
Book Description
As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material. Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms. Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.
Author: Publisher: ISBN: Category : Languages : en Pages : 38
Book Description
Grain boundary segregation in a Ni-Cr steel during temper embrittlement has been examined both by Auger electron analysis and by the analysis of etched residues from intercrystalline fracture surfaces. Auger analysis yields compositions averaged over all phases at the boundary, whereas the etching method used gives changes in ferrite only. An attempt to prevent Sb grain boundary segregation, by first segregating faster-diffusing P, did not greatly affect the embrittlement up to 1000 hours at 450C. There is one result which suggests that P may reduce Sb boundary segregation. This study will be extended to longer embrittling times. (Author).
Author: Publisher: ISBN: Category : Aeronautics Languages : en Pages : 380
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Stanford University. Department of Materials Science Publisher: ISBN: Category : Languages : en Pages : 50
Book Description
Samples of iron containing 0.07 weight % nitrogen or 0.015 weight % carbon have been given treatments similar to those used in cold work peak (CWP) measurements and examined by transmission electron microscopy. It was observed that the unusual and non-reproducible behavior of the carbon CWP can be explained by a strong tendency for carbon to form grain boundary precipitates at temperatures below those used for CWP measurements. These precipitates dissolved at the temperatures used in the CWP measurements. There was no evidence for nitrogen precipitation at grain boundaries. There was no indication of precipitation along dislocations in either carburized or nitrided samples given treatments similar to those of CWP measurements. Although it is possible that sub-electronmicroscopic clustering had occurred, this observation supports the theories of the CWP that are based on continuous atmospheres rather than on individual precipitates. (Author).
Author: A. J. Craven Publisher: CRC Press ISBN: Category : Art Languages : en Pages : 574
Book Description
These proceedings cover developments in imaging, diffraction and spectroscopy in the electron microscope, together complementary and competing techniques such as scanning optical and scanning stylus microscopies. A valuable reference source for researchers involved in the use of electron microscopy in physics, materials science and chemistry.
Author: D Williams Publisher: CRC Press ISBN: 9780750306850 Category : Science Languages : en Pages : 546
Book Description
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
Author: Vicki J. Keast
Author: Vicki J. Keast
Author: Rodenburg
Author: Pavel Lejcek
Author: 
Author: Valerie Randle
Author: 
Author: 
Author: Stanford University. Department of Materials Science
Author: A. J. Craven
Author: D Williams