Author: Dmitry Netis
Publisher:
ISBN:
Category : Asynchronous circuits
Languages : en
Pages : 176
Book Description
Analysis of Metastable Behavior Through Design and Test
Author: Dmitry Netis
Publisher:
ISBN:
Category : Asynchronous circuits
Languages : en
Pages : 176
Book Description
Publisher:
ISBN:
Category : Asynchronous circuits
Languages : en
Pages : 176
Book Description
Analog Design Issues in Digital VLSI Circuits and Systems
Author: Juan J. Becerra
Publisher: Springer Science & Business Media
ISBN: 1461561019
Category : Technology & Engineering
Languages : en
Pages : 153
Book Description
Analog Design Issues in Digital VLSI Circuits and Systems brings together in one place important contributions and up-to-date research results in this fast moving area. Analog Design Issues in Digital VLSI Circuits and Systems serves as an excellent reference, providing insight into some of the most challenging research issues in the field.
Publisher: Springer Science & Business Media
ISBN: 1461561019
Category : Technology & Engineering
Languages : en
Pages : 153
Book Description
Analog Design Issues in Digital VLSI Circuits and Systems brings together in one place important contributions and up-to-date research results in this fast moving area. Analog Design Issues in Digital VLSI Circuits and Systems serves as an excellent reference, providing insight into some of the most challenging research issues in the field.
CMOS Time-Mode Circuits and Systems
Author: Fei Yuan
Publisher: CRC Press
ISBN: 1482298740
Category : Technology & Engineering
Languages : en
Pages : 403
Book Description
Time-mode circuits, where information is represented by time difference between digital events, offer a viable and technology-friendly means to realize mixed-mode circuits and systems in nanometer complementary metal-oxide semiconductor (CMOS) technologies. Various architectures of time-based signal processing and design techniques of CMOS time-mode circuits have emerged; however, an in-depth examination of the principles of time-based signal processing and design techniques of time-mode circuits has not been available—until now. CMOS Time-Mode Circuits and Systems: Fundamentals and Applications is the first book to deliver a comprehensive treatment of CMOS time-mode circuits and systems. Featuring contributions from leading experts, this authoritative text contains a rich collection of literature on time-mode circuits and systems. The book begins by presenting a critical comparison of voltage-mode, current-mode, and time-mode signaling for mixed-mode signal processing and then: Covers the fundamentals of time-mode signal processing, such as voltage-to-time converters, all-digital phase-locked loops, and frequency synthesizers Investigates the performance characteristics, architecture, design techniques, and implementation of time-to-digital converters Discusses time-mode delta-sigma-based analog-to-digital converters, placing a great emphasis on time-mode quantizers Includes a detailed study of ultra-low-power integrated time-mode temperature measurement systems CMOS Time-Mode Circuits and Systems: Fundamentals and Applications provides a valuable reference for circuit design engineers, hardware system engineers, graduate students, and others seeking to master this fast-evolving field.
Publisher: CRC Press
ISBN: 1482298740
Category : Technology & Engineering
Languages : en
Pages : 403
Book Description
Time-mode circuits, where information is represented by time difference between digital events, offer a viable and technology-friendly means to realize mixed-mode circuits and systems in nanometer complementary metal-oxide semiconductor (CMOS) technologies. Various architectures of time-based signal processing and design techniques of CMOS time-mode circuits have emerged; however, an in-depth examination of the principles of time-based signal processing and design techniques of time-mode circuits has not been available—until now. CMOS Time-Mode Circuits and Systems: Fundamentals and Applications is the first book to deliver a comprehensive treatment of CMOS time-mode circuits and systems. Featuring contributions from leading experts, this authoritative text contains a rich collection of literature on time-mode circuits and systems. The book begins by presenting a critical comparison of voltage-mode, current-mode, and time-mode signaling for mixed-mode signal processing and then: Covers the fundamentals of time-mode signal processing, such as voltage-to-time converters, all-digital phase-locked loops, and frequency synthesizers Investigates the performance characteristics, architecture, design techniques, and implementation of time-to-digital converters Discusses time-mode delta-sigma-based analog-to-digital converters, placing a great emphasis on time-mode quantizers Includes a detailed study of ultra-low-power integrated time-mode temperature measurement systems CMOS Time-Mode Circuits and Systems: Fundamentals and Applications provides a valuable reference for circuit design engineers, hardware system engineers, graduate students, and others seeking to master this fast-evolving field.
Metastable Dynamics of Neural Ensembles
Author: Emili Balaguer-Ballester
Publisher: Frontiers Media SA
ISBN: 2889454371
Category :
Languages : en
Pages : 152
Book Description
A classical view of neural computation is that it can be characterized in terms of convergence to attractor states or sequential transitions among states in a noisy background. After over three decades, is this still a valid model of how brain dynamics implements cognition? This book provides a comprehensive collection of recent theoretical and experimental contributions addressing the question of stable versus transient neural population dynamics from complementary angles. These studies showcase recent efforts for designing a framework that encompasses the multiple facets of metastability in neural responses, one of the most exciting topics currently in systems and computational neuroscience.
Publisher: Frontiers Media SA
ISBN: 2889454371
Category :
Languages : en
Pages : 152
Book Description
A classical view of neural computation is that it can be characterized in terms of convergence to attractor states or sequential transitions among states in a noisy background. After over three decades, is this still a valid model of how brain dynamics implements cognition? This book provides a comprehensive collection of recent theoretical and experimental contributions addressing the question of stable versus transient neural population dynamics from complementary angles. These studies showcase recent efforts for designing a framework that encompasses the multiple facets of metastability in neural responses, one of the most exciting topics currently in systems and computational neuroscience.
Constructive Side-Channel Analysis and Secure Design
Author: Romain Wacquez
Publisher: Springer Nature
ISBN: 3031575431
Category :
Languages : en
Pages : 285
Book Description
Publisher: Springer Nature
ISBN: 3031575431
Category :
Languages : en
Pages : 285
Book Description
Robust Electronic Design Reference Book: no special title
Author: John R. Barnes
Publisher: Springer Science & Business Media
ISBN: 9781402077371
Category : Technology & Engineering
Languages : en
Pages : 1356
Book Description
If you design electronics for a living, you need Robust Electronic Design Reference Book. Written by a working engineer, who has put over 115 electronic products into production at Sycor, IBM, and Lexmark, Robust Electronic Design Reference covers all the various aspects of designing and developing electronic devices and systems that: -Work. -Are safe and reliable. -Can be manufactured, tested, repaired, and serviced. -May be sold and used worldwide. -Can be adapted or enhanced to meet new and changing requirements.
Publisher: Springer Science & Business Media
ISBN: 9781402077371
Category : Technology & Engineering
Languages : en
Pages : 1356
Book Description
If you design electronics for a living, you need Robust Electronic Design Reference Book. Written by a working engineer, who has put over 115 electronic products into production at Sycor, IBM, and Lexmark, Robust Electronic Design Reference covers all the various aspects of designing and developing electronic devices and systems that: -Work. -Are safe and reliable. -Can be manufactured, tested, repaired, and serviced. -May be sold and used worldwide. -Can be adapted or enhanced to meet new and changing requirements.
Energy Research Abstracts
Proceedings of the Eighth IASTED International Symposium Applied Informatics
Author: International Association of Science and Technology for Development
Publisher: Anaheim [Calif.] ; Calgary : Acta Press
ISBN: 9780889861428
Category : Computers
Languages : en
Pages : 510
Book Description
Publisher: Anaheim [Calif.] ; Calgary : Acta Press
ISBN: 9780889861428
Category : Computers
Languages : en
Pages : 510
Book Description
Advanced Tribology
Author: Jianbin Luo
Publisher: Springer Science & Business Media
ISBN: 3642036538
Category : Technology & Engineering
Languages : en
Pages : 1040
Book Description
"Advanced Tribology" is the proceedings of the 5th China International Symposium on Tribology (held every four years) and the 1st International Tribology Symposium of IFToMM, held in Beijing 24th-27th September 2008. It contains seven parts: lubrication; friction and wear; micro/nano-tribology; tribology of coatings, surface and interface; biotribology; tribo-chemistry; industry tribology. The book reflects the recent progress in the fields such as lubrication, friction and wear, coatings, and precision manufacture etc. in the world. The book is intended for researchers, engineers and graduate students in the field of tribology, lubrication, mechanical production and industrial design. The editors Jianbin Luo, Yonggang Meng, Tianmin Shao and Qian Zhao are all the professors at the State Key Lab of Tribology, Tsinghua University, Beijing.
Publisher: Springer Science & Business Media
ISBN: 3642036538
Category : Technology & Engineering
Languages : en
Pages : 1040
Book Description
"Advanced Tribology" is the proceedings of the 5th China International Symposium on Tribology (held every four years) and the 1st International Tribology Symposium of IFToMM, held in Beijing 24th-27th September 2008. It contains seven parts: lubrication; friction and wear; micro/nano-tribology; tribology of coatings, surface and interface; biotribology; tribo-chemistry; industry tribology. The book reflects the recent progress in the fields such as lubrication, friction and wear, coatings, and precision manufacture etc. in the world. The book is intended for researchers, engineers and graduate students in the field of tribology, lubrication, mechanical production and industrial design. The editors Jianbin Luo, Yonggang Meng, Tianmin Shao and Qian Zhao are all the professors at the State Key Lab of Tribology, Tsinghua University, Beijing.
Wafer-Level Integrated Systems
Author: Stuart K. Tewksbury
Publisher: Springer Science & Business Media
ISBN: 1461316251
Category : Technology & Engineering
Languages : en
Pages : 456
Book Description
From the perspective of complex systems, conventional Ie's can be regarded as "discrete" devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term "wafer level" is perhaps more appropriate than "wafer-scale". A "wafer-level" monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, "wafer-scale" merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit.
Publisher: Springer Science & Business Media
ISBN: 1461316251
Category : Technology & Engineering
Languages : en
Pages : 456
Book Description
From the perspective of complex systems, conventional Ie's can be regarded as "discrete" devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term "wafer level" is perhaps more appropriate than "wafer-scale". A "wafer-level" monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, "wafer-scale" merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit.