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Author: Douglas Self Publisher: Taylor & Francis ISBN: 0750680725 Category : Technology & Engineering Languages : en Pages : 488
Book Description
Preface; Introduction and general survey; History, architecture and negative feedback; The general principles of power amplifiers; The small signal stages; The Class-B output stage; The output stage II; Compensation, slew-rate, and stability; Power supplies and PSRR; Class-A power amplifiers; Class D power amplifiers; Class-G power amplifiers; FET output stages; Thermal compensation and thermal dynamics; Amplifier and loudspeaker protection; Grounding and practical matters; Testing and safety; Index.
Author: Douglas Self Publisher: Taylor & Francis ISBN: 0750680725 Category : Technology & Engineering Languages : en Pages : 488
Book Description
Preface; Introduction and general survey; History, architecture and negative feedback; The general principles of power amplifiers; The small signal stages; The Class-B output stage; The output stage II; Compensation, slew-rate, and stability; Power supplies and PSRR; Class-A power amplifiers; Class D power amplifiers; Class-G power amplifiers; FET output stages; Thermal compensation and thermal dynamics; Amplifier and loudspeaker protection; Grounding and practical matters; Testing and safety; Index.
Author: Enrico Rubiola Publisher: Cambridge University Press ISBN: 9780521153287 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Presenting a comprehensive account of oscillator phase noise and frequency stability, this practical text is both mathematically rigorous and accessible. An in-depth treatment of the noise mechanism is given, describing the oscillator as a physical system, and showing that simple general laws govern the stability of a large variety of oscillators differing in technology and frequency range. Inevitably, special attention is given to amplifiers, resonators, delay lines, feedback, and flicker (1/f) noise. The reverse engineering of oscillators based on phase-noise spectra is also covered, and end-of-chapter exercises are given. Uniquely, numerous practical examples are presented, including case studies taken from laboratory prototypes and commercial oscillators, which allow the oscillator internal design to be understood by analyzing its phase-noise spectrum. Based on tutorials given by the author at the Jet Propulsion Laboratory, international IEEE meetings, and in industry, this is a useful reference for academic researchers, industry practitioners, and graduate students in RF engineering and communications engineering.
Author: Marius Bazu Publisher: John Wiley & Sons ISBN: 1119990009 Category : Technology & Engineering Languages : en Pages : 372
Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Author: Joseph Weber Publisher: Courier Corporation ISBN: 0486438872 Category : Science Languages : en Pages : 210
Book Description
An internationally famous physicist and electrical engineer, the author of this text was a pioneer in the investigation of gravitational waves. Joseph Weber's General Relativity and Gravitational Waves offers a classic treatment of the subject. Appropriate for upper-level undergraduates and graduate students, this text remains ever relevant. Brief but thorough in its introduction to the foundations of general relativity, it also examines the elements of Riemannian geometry and tensor calculus applicable to this field. Approximately a quarter of the contents explores theoretical and experimental aspects of gravitational radiation. The final chapter focuses on selected topics related to general relativity, including the equations of motion, unified field theories, Friedman's solution of the cosmological problem, and the Hamiltonian formulation of general relativity. Exercises. Index.
Author: Ton J. Mouthaan Publisher: Springer Science & Business Media ISBN: 9401151105 Category : Technology & Engineering Languages : en Pages : 299
Book Description
Dear participant in the second European Workshop on Microelectronics Education, It is a pleasure to present you the Proceedings of the Second European Workshop on Microelectronics Education and to welcome you at the Workshop. The Organising Committee is very pleased that it has found several key persons, with highly appreciated levels of knowledge and expertise, willing to present Invited Contributions to this Workshop. We have striven for an interesting spread over important areas like the expected demands for educated engineers in the wide field of Microelectronics, and Microsystems, in European industry (and beyond!) and innovations in method and focus of our educational programmes. This is the second European Workshop in this area; the first one was held in Grenoble in France in the spring of 1996. It was the initiative of Georges Kamarinos, Nadine Guillemot and Bernard Courtois to organise this Workshop because they felt that Microelectronics was 'at a turning point' to become the core of the largest industry in the world and that this warranted a serious (re-)consideration of our educational imperatives. It is now two years since and their feeling has become reality: nobody doubts that by the year 2000 the microelecnonics industry will be the largest industrial sector. It is also obvious that because of that and because of the predicted shortfall of educated engineers we must continuously reconsider the quality of our educational approach.
Author: Gunter Kompa Publisher: Artech House ISBN: 1630817457 Category : Technology & Engineering Languages : en Pages : 609
Book Description
All model parameters are fundamentally coupled together, so that directly measured individual parameters, although widely used and accepted, may initially only serve as good estimates. This comprehensive resource presents all aspects concerning the modeling of semiconductor field-effect device parameters based on gallium-arsenide (GaAs) and gallium nitride (GaN) technology. Metal-semiconductor field-effect transistors (MESFETs), high electron mobility transistors (HEMTs) and heterojunction bipolar transistors (HBTs), their structures and functions, and existing transistor models are also classified. The Shockley model is presented in order to give insight into semiconductor field-effect transistor (FET) device physics and explain the relationship between geometric and material parameters and device performance. Extraction of trapping and thermal time constants is discussed. A special section is devoted to standard nonlinear FET models applied to large-signal measurements, including static-/pulsed-DC and single-/two-tone stimulation. High power measurement setups for signal waveform measurement, wideband source-/load-pull measurement (including envelope source-/load pull) are also included, along with high-power intermodulation distortion (IMD) measurement setup (including envelope load-pull). Written by a world-renowned expert in the field, this book is the first to cover of all aspects of semiconductor FET device modeling in a single volume.
Author: Douglas Self
Author: Douglas Self
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Author: Enrico Rubiola
Author: Marius Bazu
Author: Joseph Weber
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Author: Ton J. Mouthaan
Author: Gunter Kompa