Author: Gordon W RobertsPublisher:
ISBN: 9781461523420
Category :
Languages : en
Pages : 136
Book Description
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Author: Gordon W RobertsPublisher:
ISBN: 9781461523420
Category :
Languages : en
Pages : 136
Book Description
Analog and Mixed-signal Test
Author: Bapiraju VinnakotaPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 296
Book Description
More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Author: Gordon W. RobertsPublisher: Springer Science & Business Media
ISBN: 1461523419
Category : Technology & Engineering
Languages : en
Pages : 125
Book Description
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
A BIST (built-in Self-test) Strategy for Mixed-signal Integrated Circuits
Author: Hongzhi LiPublisher:
ISBN:
Category : Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit
Languages : en
Pages : 172
Book Description
On-chip Signal Generation and Response Waveform Extraction for Analog Built-in Self-test
Author: Brian PolingPublisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 121
Book Description
Built-In Self-Test (BIST) is a method of designing and creating an electronic chip or an electronic system that can self test for correct functionality and ensure no manufacturing defects. The reason for analog BIST is the testing of analog parts of analog and mixed-signal ICs is a costly process that traditionally requires the use of expensive high-end automatic test equipment. Due to the nature of the testing and length of the testing process, an efficient analog BIST scheme is in high demand for the ever increasing complexity of analog and mixed-signal circuits. This thesis presents a BIST scheme for generation and response waveform extraction that allows the detection of a faulty circuit design. Along with the detection, an approach to test high speed analog and mixed-signal circuits with test signals upwards of 1GHz is presented. A practical application is to test analog or mixed-signal IC that has a wide bandwidth ADC in its front-end. The BIST scheme includes a method to store the test signal and generate it for the circuit to be tested along with a way to extract the response test signal from multiple test points and allow fault detection. Along with this research, a stepping stone is implemented for analog modeling using MATLAB for accuracy and speed of circuit simulations. The problems associated with the BIST scheme and analog modeling is discussed, along with recommendations.
Mixed Signal Built-In Self-Test for Analog Circuits
Author: Charles E. StroudPublisher:
ISBN:
Category : Analog computer simultion
Languages : en
Pages : 0
Book Description
A Built-In Self-Test architecture was developed for testing analog circuits in mixed-signal systems. The Built-In Self-Test circuitry primarily resides in the digital portion of the mixed-signal system in order to minimize performance impact on the analog circuitry. The test pattern generation portion of the Built-In Self-Test circuitry produces a number of different test waveforms found to be effective in detecting faults in the analog circuitry. The output response analysis function consists of a double-precision accumulator that facilitates determination of the faulty/fault-free status of an analog circuit with acceptable component parameter variations. Ten benchmark circuits were established for the evaluation of analog testing approaches along with acceptable component parameter variations and a standard set of faults and fault models for each benchmark circuit. Finally, an equation was developed for the calculation of analog fault coverage that takes into consideration the probability of potential detection of faults due to component parameter variation. Evaluation of the Built-In Self-Test architecture via analog fault simulation using the benchmark circuits and the fault coverage equation indicates that the approach is effective in detecting catastrophe and parametric faults in a wide variety of analog circuits.
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Author: Yichuang SunPublisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Mixed Signal Built-in Self-test for Analog Circuits
Author: Charles E. StroudPublisher:
ISBN:
Category : Analog computer simultion
Languages : en
Pages : 128
Book Description
Mixed Signal Based Built-in Self-test for Analog Circuits
Author: Kristi MaggardFault Diagnosis of Analog Integrated Circuits
Author: Prithviraj KabisatpathyPublisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183
Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.