An Atom-probe Field-ion Microscope Study of the Range and Diffusivity of Helium in Tungsten PDF Download

Author: Alfred Wagner
Publisher:
ISBN:
Category : Helium ions
Languages : en
Pages : 582

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ISBN:
Category :
Languages : en
Pages :

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A time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. With this automated system 600 TOF min/sup -1/ can be recorded and analyzed. Performance tests of the instrument demonstrated that (1) the seven isotopes of molybdenum and the five isotopes of tungsten can be clearly resolved; and (2) the concentration and spatial distribution of all constitutents present at levels greater than 0.05 at. % in a W--25 at. % Re, Mo--1.0 at. % Ti, Mo--1.0 at. % Ti--0.08 at. % Zr (TZM), a low swelling stainless steel (LS1A) and a metallic glass (Metglas 2826) can be measured. The effect of the rate of field evaporation on the quantitative atom probe analysis of a Mo--1.0 at. % Ti alloy and a Mo--1.0 at. % Ti--0.08 at. % Zr alloy was investigated. As the field evaporation rate increased the measured Ti concentration was found to also increase. A simple qualitative model was proposed to explain the observation. The spatial distribution of titanium in a fast neutron irradiated Mo--1.0 at. % Ti alloy has been investigated. No evidence of Ti segregation to the voids was detected nor has any evidence of significant resolution of Ti from the TiC precipitates been detected. A small amount of segregation of carbon to a void was detected.

Author:
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Category : Aeronautics
Languages : en
Pages : 994

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Author:
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Category : Power resources
Languages : en
Pages : 900

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Author: Tien T. Tsong
Publisher: Cambridge University Press
ISBN: 0521363799
Category : Science
Languages : en
Pages : 399

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Book Description
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

Author: Victor G. Weizer
Publisher:
ISBN:
Category : Adsorption
Languages : en
Pages : 20

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Author: Baptiste Gault
Publisher: Springer Science & Business Media
ISBN: 146143436X
Category : Technology & Engineering
Languages : en
Pages : 411

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Book Description
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Author:
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ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 720

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Author: Kenneth Lane Wilson
Publisher:
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Category : Irradiation
Languages : en
Pages : 324

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Author: United States. Energy Research and Development Administration
Publisher:
ISBN:
Category : Energy conservation
Languages : en
Pages : 1324

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