Author: United States. Department of the Air Force
Publisher:
ISBN:
Category :
Languages : en
Pages : 818
Book Description
Personnel
Author: United States. Department of the Air Force
Publisher:
ISBN:
Category :
Languages : en
Pages : 818
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 818
Book Description
Joint Task Force Planning Guidance and Procedures
Author: United States. Joint Chiefs of Staff
Publisher:
ISBN:
Category : Military planning
Languages : en
Pages : 152
Book Description
Publisher:
ISBN:
Category : Military planning
Languages : en
Pages : 152
Book Description
U.S. Army Requirements for Weather and Climatological Support
Author: United States. Department of the Army
Publisher:
ISBN:
Category : Meteorological services
Languages : en
Pages : 20
Book Description
Publisher:
ISBN:
Category : Meteorological services
Languages : en
Pages : 20
Book Description
Weather Support for Field Army Tactical Operations
Author: United States. Department of the Army
Publisher:
ISBN:
Category : Weather forecasting
Languages : en
Pages : 92
Book Description
Publisher:
ISBN:
Category : Weather forecasting
Languages : en
Pages : 92
Book Description
Conductive Atomic Force Microscopy
Author: Mario Lanza
Publisher: John Wiley & Sons
ISBN: 3527340912
Category : Science
Languages : en
Pages : 382
Book Description
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Publisher: John Wiley & Sons
ISBN: 3527340912
Category : Science
Languages : en
Pages : 382
Book Description
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Index of Doctrinal, Training and Organizational Publications
Author: United States. Department of the Army
Publisher:
ISBN:
Category : Military art and science
Languages : en
Pages : 124
Book Description
Publisher:
ISBN:
Category : Military art and science
Languages : en
Pages : 124
Book Description
Military Intelligence
Author:
Publisher:
ISBN:
Category : Military intelligence
Languages : en
Pages : 694
Book Description
Publisher:
ISBN:
Category : Military intelligence
Languages : en
Pages : 694
Book Description
Microcantilevers for Atomic Force Microscope Data Storage
Author: Benjamin W. Chui
Publisher: Springer Science & Business Media
ISBN: 1461549833
Category : Technology & Engineering
Languages : en
Pages : 174
Book Description
Microcantilevers for Atomic Force Microscope Data Storage describes a research collaboration between IBM Almaden and Stanford University in which a new mass data storage technology was evaluated. This technology is based on the use of heated cantilevers to form submicron indentations on a polycarbonate surface, and piezoresistive cantilevers to read those indentations. Microcantilevers for Atomic Force Microscope Data Storage describes how silicon micromachined cantilevers can be used for high-density topographic data storage on a simple substrate such as polycarbonate. The cantilevers can be made to incorporate resistive heaters (for thermal writing) or piezoresistive deflection sensors (for data readback). The primary audience for Microcantilevers for Atomic Force Microscope Data Storage is industrial and academic workers in the microelectromechanical systems (MEMS) area. It will also be of interest to researchers in the data storage industry who are investigating future storage technologies.
Publisher: Springer Science & Business Media
ISBN: 1461549833
Category : Technology & Engineering
Languages : en
Pages : 174
Book Description
Microcantilevers for Atomic Force Microscope Data Storage describes a research collaboration between IBM Almaden and Stanford University in which a new mass data storage technology was evaluated. This technology is based on the use of heated cantilevers to form submicron indentations on a polycarbonate surface, and piezoresistive cantilevers to read those indentations. Microcantilevers for Atomic Force Microscope Data Storage describes how silicon micromachined cantilevers can be used for high-density topographic data storage on a simple substrate such as polycarbonate. The cantilevers can be made to incorporate resistive heaters (for thermal writing) or piezoresistive deflection sensors (for data readback). The primary audience for Microcantilevers for Atomic Force Microscope Data Storage is industrial and academic workers in the microelectromechanical systems (MEMS) area. It will also be of interest to researchers in the data storage industry who are investigating future storage technologies.
Polymer Microscopy
Author: Linda Sawyer
Publisher: Springer Science & Business Media
ISBN: 0387726284
Category : Science
Languages : en
Pages : 568
Book Description
This extensively updated and revised Third Edition is a comprehensive and practical guide to the study of the microstructure of polymers. It is the result of the authors' many years of academic and industrial experience. Introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy are considered. The book closes with a problem solving guide.
Publisher: Springer Science & Business Media
ISBN: 0387726284
Category : Science
Languages : en
Pages : 568
Book Description
This extensively updated and revised Third Edition is a comprehensive and practical guide to the study of the microstructure of polymers. It is the result of the authors' many years of academic and industrial experience. Introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy are considered. The book closes with a problem solving guide.
Monthly Catalogue, United States Public Documents
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1388
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1388
Book Description