Advancing Metrology for Electrotechnology to Support the U.S. Economy PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Advancing Metrology for Electrotechnology to Support the U.S. Economy PDF full book. Access full book title Advancing Metrology for Electrotechnology to Support the U.S. Economy by Joanne Surette. Download full books in PDF and EPUB format.
Author: Joanne Surette Publisher: DIANE Publishing ISBN: 078817701X Category : Languages : en Pages : 85
Book Description
Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
Author: Joanne Surette Publisher: DIANE Publishing ISBN: 078817701X Category : Languages : en Pages : 85
Book Description
Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
Author: JoAnne M. Surette Publisher: DIANE Publishing ISBN: 9780788183171 Category : Technology Languages : en Pages : 80
Book Description
The Electronics and Electrical Engineering Laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement and other generic technology critical to the competitiveness of the U.S. electronics industry and the U.S. electricity-equipment industry. This report summarizes selected technical accomplishments and describes activities conducted by the Lab in FY 1998. Also included are profiles of EEEL's organization, customer interactions, and long-term goals. Appendix includes crosswalk of EEEL programs and projects; EEEL FY1998 resources; EEEL FY1998 CRADAS; and EEEL organization chart.
Author: Waldemar Karwowski Publisher: CRC Press ISBN: 1482289679 Category : Computers Languages : en Pages : 644
Book Description
A comprehensive review of international and national standards and guidelines, this handbook consists of 32 chapters divided into nine sections that cover standardization efforts, anthropometry and working postures, designing manual material, human-computer interaction, occupational health and safety, legal protection, military human factor standar
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies Publisher: ISBN: Category : Courts Languages : en Pages : 1700
Author: Joanne Surette Publisher: ISBN: 9781437901368 Category : Languages : en Pages : 54
Book Description
Reviews some of the fascinating work completed by the Nat. Institute of Standards and Technology (NIST) Laboratory completed in 1996 in the fields of semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, and national electrical standards. Illustrations.
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies Publisher: ISBN: Category : Medical Languages : en Pages : 1692
Author: Joanne Surette
Author: Joanne Surette
Author: JoAnne M. Surette
Author: National Institute of Standards and Technology (U.S.)
Author: American Society for Testing and Materials
Author: Waldemar Karwowski
Author: 
Author: Ed Bowker Staff
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies
Author: Joanne Surette
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies