Author: William M. MuellerPublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Advances in x-ray analysis : proceedings of the Fourteenth Annual Conference on Application of X-ray Analysis, Denver, Colorado, 1965
Author: William M. MuellerAdvances in X-Ray Analysis
Author: Gavin R. MallettPublisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Advances in X-Ray Analysis
Author: William M. MuellerPublisher: Springer
ISBN: 9780306381058
Category : Science
Languages : en
Pages : 564
Book Description
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.
Advances in X-ray Analysis
Author: Gavin R. MallettAdvances in X-Ray Analysis
Author: Conference on Applications of X-Ray AnalysisPublisher:
ISBN: 9780835751926
Category :
Languages : en
Pages : 554
Book Description
Advances in X-ray Analysis
Author: Gavin R. MallettAdvances in X-ray Analysis
Author: Advances in X-ray Analysis
Author: Denver Research InstitutePublisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages : 544
Book Description
Author: William M. Mueller
Author: Gavin R. Mallett