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Author: R. K. Leach Publisher: ISBN: 9780750325271 Category : SCIENCE Languages : en Pages :
Book Description
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: R. K. Leach Publisher: ISBN: 9780750325271 Category : SCIENCE Languages : en Pages :
Book Description
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: ISBN: 9780750325288 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: ISBN: 9780750325240 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: Springer Science & Business Media ISBN: 3642120121 Category : Technology & Engineering Languages : en Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Author: Richard Leach Publisher: Myprint ISBN: 9780750325257 Category : Languages : en Pages : 230
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (e.g. in additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Key Features Provides cutting-edge advances in the field Includes new ISO framework for performance verification Presents advances in artificial intelligence Includes advances in in-process measurement Discusses a forward look at calibration
Author: Aaron M. Michalko Publisher: ISBN: Category : Languages : en Pages : 217
Book Description
"This thesis presents advances in the application of phase retrieval techniques to optical metrology of spherical and freeform surfaces. We explore metrology configurations using transverse translation-diverse phase retrieval (TTDPR), in which translating subaperture illumination is projected on the test surface. The wavefront aberration, and from it surface error, can be reconstructed from measured reflected intensities. TTDPR is advantageous for freeform surface metrology due to its relatively simple hardware requirements and demonstrated accuracy in other fields. Through simulations we probe TTDPR performance as a function of various parameters including illumination beam softness, detector signal-to-noise ratio and position uncertainty of the illumination. We report on the laboratory measurement of a concave spherical test surface using TTDPR, which agrees with an interferometric measurement to 0:006[lambda] root-mean-square (RMS) with certain terms removed. We report on measurements of a concave freeform using TTDPR. Freeform surface reconstructions from two disjoint datasets agree to 13 nm RMS, or 0:02[lambda] RMS at [lambda] = 632:8nm. Next we explore configurations suitable for metrology of convex surfaces. We explore a configuration using converging source illumination and a moving test surface. We discuss a suitable algorithm, prescription retrieval, with which we directly reconstruct surface prescription terms from measured intensities using combined ray-tracing and diffraction modeling. A prescription retrieval algorithm is demonstrated through simulation and ultimately a convex surface measurement using the technique is demonstrated"--Pages xi-xii.
Author: Richard Leach Publisher: Springer Science & Business Media ISBN: 3642364586 Category : Technology & Engineering Languages : en Pages : 355
Book Description
The function of a component part can be profoundly affected by its surface topography. There are many examples in nature of surfaces that have a well-controlled topography to affect their function. Examples include the hydrophobic effect of the lotus leaf, the reduction of fluid drag due to the riblet structure of shark skin, the directional adhesion of the gecko foot and the angular sensitivity of the multi-faceted fly eye. Surface structuring is also being used extensively in modern manufacturing. In this way many properties can be altered, for example optical, tribological, biological and fluidic. Previously, single line (profile) measurements were adequate to control manufacture of surfaces, but as the need to control the functionality of surfaces increases, there is a growing need for three-dimensional (areal) measurement and characterisation techniques. For this reason there has been considerable research, development and standardisation of areal techniques. This book will present the areal framework that is being adopted by the international community. Whereas previous books have concentrated on the measurement aspects, this book concentrates on the characterisation techniques, i.e. how to interpret the measurement data to give the appropriate (functional) information for a given task. The first part of the book presents the characterisation methods and the second part case studies that highlight the use of areal methods in a broad range of subject areas - from automobile manufacture to archaeology. Contents Introduction to Surface Topography The Areal Field Parameters The Areal Feature Parameters Areal Filtering Methods Areal Form Removal Areal Fractal Methods Choosing the Appropriate Parameter Characterisation of Individual Areal Features Multi-Scale Signature of Surface Topography Correlation of Areal Surface Texture Parameters to Solar Cell Efficiency Characterisation of Cylinder Liner Honing Textures for Production Control Characterisation of the Mechanical Bond Strength for Copper on Glass Plating Applications Inspection of Laser Structured Cams and Conrods Road Surfaces
Author: X. Jane Jiang Publisher: Academic Press ISBN: 0128218169 Category : Technology & Engineering Languages : en Pages : 376
Book Description
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software
Author: R. K. Leach
Author: R. K. Leach
Author: Richard Leach
Author: Richard Leach
Author: Richard Leach
Author: Richard Leach
Author: Richard Leach
Author: Aaron M. Michalko
Author: Richard Leach
Author: Richard Leach
Author: X. Jane Jiang