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Author: Richard Leach Publisher: ISBN: 9780750325240 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: ISBN: 9780750325240 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: Myprint ISBN: 9780750325257 Category : Languages : en Pages : 230
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (e.g. in additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Key Features Provides cutting-edge advances in the field Includes new ISO framework for performance verification Presents advances in artificial intelligence Includes advances in in-process measurement Discusses a forward look at calibration
Author: R. K. Leach Publisher: ISBN: 9780750325271 Category : SCIENCE Languages : en Pages :
Book Description
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach Publisher: ISBN: 9780750325288 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Kjell J. Gåsvik Publisher: John Wiley & Sons ISBN: 0470846704 Category : Technology & Engineering Languages : en Pages : 372
Book Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Author: Robert Roithmeier Publisher: Carl Zeiss AG ISBN: Category : Languages : en Pages : 111
Book Description
Today, there is hardly any workpiece whose form parameters cannot be measured by means of coordinate measuring machines. The universal use of these machines allows a wide range of application of this technology which, however, increases inevitably the complexity of its handling. The numerous options of the machine-specific operating software on the one hand and the various theoretical considerations regarding a target-oriented treatment of measuring jobs on the other hand result in the fact that the measuring results obtained from the same coordinate measuring machine on the same workpiece under similar conditions may differ. In Order to increase the comparability of measuring results, it is necessary to provide the operators of coordinate measuring machines –in addition to a well-founded AUKOM training – with procedure options for planning, performing, evaluating and documenting measurements. This book by the ZEISS Metrology Academy makes a contribution towards achieving these targets.
Author: Jerzy A. Sładek Publisher: Springer ISBN: 366248465X Category : Technology & Engineering Languages : en Pages : 472
Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.
Author: Richard Leach
Author: Richard Leach
Author: Richard Leach
Author: R. K. Leach
Author: Richard Leach
Author: Kjell J. Gåsvik
Author: Richard Leach
Author: Jerzy Sładek
Author: Robert Roithmeier
Author: Richard Leach
Author: Jerzy A. Sładek