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Author: Jerzy A. Sładek Publisher: Springer ISBN: 366248465X Category : Technology & Engineering Languages : en Pages : 472
Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.
Author: Jerzy A. Sładek Publisher: Springer ISBN: 366248465X Category : Technology & Engineering Languages : en Pages : 472
Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.
Author: Richard Leach Publisher: ISBN: 9780750325240 Category : Metrology Languages : en Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Robert J. Hocken Publisher: CRC Press ISBN: 1420017535 Category : Technology & Engineering Languages : en Pages : 586
Book Description
Since John Bosch edited and published the first version of this book in 1995, the world of manufacturing and coordinate measuring machines (CMMs) and coordinate measuring systems (CMSs) has changed considerably. However, the basic physics of the machines has not changed in essence but have become more deeply understood. Completely revised and updat
Author: John A. Bosch Publisher: CRC Press ISBN: 9780824795818 Category : Technology & Engineering Languages : en Pages : 476
Book Description
This work reviews the basic concepts of co-ordinate metrology. It defines what co-ordinate measuring machines (CMMs) are and details how they can be applied to gain a competitive advantage in a variety of business settings, from small machine shops to global manufacturers. Areas that are critical for the successful application of CMMs - including environmental factors, the measuring of speed and accuracy, traceability, versatility and programming methodology - are considered.;The book is intended for manufacturing, mechanical, quality control, design, industrial, automation, automotive and aerospace engineers and managers, as wel as upper-level undergraduate and graduate students in these disciplines.;College or university bookstores may order five or more copies at a special student price, which is available from Marcel Dekker Inc upon request.
Author: Kuang-Chao Fan Publisher: MDPI ISBN: 3038422762 Category : Science Languages : en Pages : 1
Book Description
This book is a printed edition of the Special Issue "Design and Applications of Coordinate Measuring Machines" that was published in Applied Sciences
Author: Alistair B Forbes Publisher: World Scientific ISBN: 981327431X Category : Mathematics Languages : en Pages : 458
Book Description
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Author: X. Jane Jiang Publisher: Academic Press ISBN: 0128218169 Category : Technology & Engineering Languages : en Pages : 376
Book Description
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. - Includes case studies in every chapter to help readers implement the techniques discussed - Provides unique advice from industry on hot subjects, including surface description and data processing - Features links to online content, including video, code and software
Author: Patrizia Ciarlini Publisher: World Scientific ISBN: 9814493635 Category : Mathematics Languages : en Pages : 334
Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Author: Franco Pavese Publisher: World Scientific ISBN: 9814397946 Category : Computers Languages : en Pages : 468
Book Description
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Author: P. Ciarlini Publisher: World Scientific ISBN: 9789810244941 Category : Mathematics Languages : en Pages : 396
Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
Author: Jerzy A. Sładek
Author: Jerzy A. Sładek
Author: Richard Leach
Author: Robert J. Hocken
Author: John A. Bosch
Author: Kuang-Chao Fan
Author: Alistair B Forbes
Author: X. Jane Jiang
Author: Patrizia Ciarlini
Author: Franco Pavese
Author: P. Ciarlini