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Author: Ankdrew Parvel Publisher: Trans Tech Publications Ltd ISBN: 3038267597 Category : Technology & Engineering Languages : en Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Author: Ankdrew Parvel Publisher: Trans Tech Publications Ltd ISBN: 3038267597 Category : Technology & Engineering Languages : en Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Author: Andy Wu Publisher: Trans Tech Publications Ltd ISBN: 3038260975 Category : Technology & Engineering Languages : en Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Author: Yanwen Wu Publisher: Trans Tech Publications ISBN: 9780878492718 Category : Electric measurements Languages : en Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Author: Riza Esa Publisher: Trans Tech Publications Ltd ISBN: 3038136271 Category : Technology & Engineering Languages : en Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Author: Publisher: IOS Press ISBN: Category : Languages : en Pages : 4576
Author: Robert J. Wright Publisher: SAGE ISBN: 1412949173 Category : Education Languages : en Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).
Author: Ankdrew Parvel
Author: Ankdrew Parvel
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Author: Andy Wu
Author: Yanwen Wu
Author: Riza Esa
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Author: Martin G. Buehler
Author: Robert J. Wright