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Author: Riza Esa Publisher: Trans Tech Publications Ltd ISBN: 3038136271 Category : Technology & Engineering Languages : en Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Author: Riza Esa Publisher: Trans Tech Publications Ltd ISBN: 3038136271 Category : Technology & Engineering Languages : en Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Author: Andy Wu Publisher: Trans Tech Publications Ltd ISBN: 3038260975 Category : Technology & Engineering Languages : en Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Author: Publisher: ISBN: Category : Languages : en Pages : 15
Book Description
This second collection on "Advanced Measurement and Test II" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics. Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device.
Author: Yanwen Wu Publisher: Trans Tech Publications ISBN: 9780878492718 Category : Electric measurements Languages : en Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Author: Yanwen Wu Publisher: Trans Tech Publications Ltd ISBN: 3038133531 Category : Technology & Engineering Languages : en Pages : 1730
Book Description
This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.
Author: Ankdrew Parvel Publisher: Trans Tech Publications Ltd ISBN: 3038267597 Category : Technology & Engineering Languages : en Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Author: Yanwen Wu Publisher: Trans Tech Publications Ltd ISBN: 3038134074 Category : Technology & Engineering Languages : en Pages : 1586
Book Description
The volume consists of a collection of 124 peer-reviewed papers contributed by experts from all over the world. The topics covered include: new developments and applications in materials forming, subtractive, additive and joining processes, processing of advanced materials such as composites, polymers, semiconductors and bio-materials, and new development in the micro/nano-fabrication of engineering materials.
Author: Robert J. Wright Publisher: SAGE ISBN: 1412949173 Category : Education Languages : en Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).
Author: Riza Esa
Author: Riza Esa
Author: Andy Wu
Author: 
Author: Yanwen Wu
Author: Yanwen Wu
Author: Ankdrew Parvel
Author: Jitendra Sharma
Author: Yanwen Wu
Author: International Conference on Advanced Measurement and Test
Author: Robert J. Wright