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Author: Patrizia Ciarlini Publisher: World Scientific ISBN: 9814493635 Category : Mathematics Languages : en Pages : 334
Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Author: Patrizia Ciarlini Publisher: World Scientific ISBN: 9814493635 Category : Mathematics Languages : en Pages : 334
Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Author: Patrizia Ciarlini Publisher: World Scientific ISBN: 981449190X Category : Mathematics Languages : en Pages : 393
Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
Author: P. Ciarlini Publisher: World Scientific ISBN: 9812774181 Category : Mathematics Languages : en Pages : 384
Book Description
This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Sample Chapter(s). Chapter 1: Modelling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (537 KB). Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Bnr et al.); Mereotopological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations and Robust Control Charts in SPC (M I Gomes & F O Figueiredo); Multisensor Data Fusion and Its Application to Decision Making (P S Giruo et al.); Generic System Design for Measurement Databases OCo Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gross et al.); Evaluation of Repeated Measurements from the Viewpoint of Conventional and Bayesian Statistics (I Lira & W WAger); Detection of Outliers in Interlaboratory Testing (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis OCo A Dialogue with the Data (D S Sivia); Validation of Soft Sensors in Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Measurement System Analysis and Statistical Process Control (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Degree of Equivalence in MRA Key Comparisons and of Its Uncertainty (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Khne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology."
Author: Patrizia Ciarlini Publisher: World Scientific ISBN: 9814482412 Category : Computers Languages : en Pages : 367
Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in:Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences
Author: Franco Pavese Publisher: World Scientific ISBN: 9812839526 Category : Technology & Engineering Languages : en Pages : 419
Book Description
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author: Alistair B Forbes Publisher: World Scientific ISBN: 981327431X Category : Mathematics Languages : en Pages : 458
Book Description
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Author: Franco Pavese Publisher: World Scientific ISBN: 9814678635 Category : Mathematics Languages : en Pages : 446
Book Description
This volume contains original and refereed contributions from the tenth AMCTM Conference (www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Author: Franco Pavese Publisher: World Scientific ISBN: 9814397946 Category : Computers Languages : en Pages : 468
Book Description
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Author: Franco Pavese Publisher: World Scientific ISBN: 9812839518 Category : Mathematics Languages : en Pages : 419
Book Description
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author: Emmanuil H Georgoulis Publisher: Springer Science & Business Media ISBN: 3642168760 Category : Mathematics Languages : en Pages : 310
Book Description
This book collects up-to-date papers from world experts in a broad variety of relevant applications of approximation theory, including dynamical systems, multiscale modelling of fluid flow, metrology, and geometric modelling to mention a few. The 14 papers in this volume document modern trends in approximation through recent theoretical developments, important computational aspects and multidisciplinary applications. The book is arranged in seven invited surveys, followed by seven contributed research papers. The surveys of the first seven chapters are addressing the following relevant topics: emergent behaviour in large electrical networks, algorithms for multivariate piecewise constant approximation, anisotropic triangulation methods in adaptive image approximation, form assessment in coordinate metrology, discontinuous Galerkin methods for linear problems, a numerical analyst's view of the lattice Boltzmann method, approximation of probability measures on manifolds. Moreover, the diverse contributed papers of the remaining seven chapters reflect recent developments in approximation theory, approximation practice and their applications. Graduate students who wish to discover the state of the art in a number of important directions of approximation algorithms will find this a valuable volume. Established researchers from statisticians through to fluid modellers will find interesting new approaches to solving familiar but challenging problems. This book grew out of the sixth in the conference series on "Algorithms for Approximation", which took place from 31st August to September 4th 2009 in Ambleside in the Lake District of the United Kingdom.
Author: Patrizia Ciarlini
Author: Patrizia Ciarlini
Author: Patrizia Ciarlini
Author: P. Ciarlini
Author: Patrizia Ciarlini
Author: Franco Pavese
Author: Alistair B Forbes
Author: Franco Pavese
Author: Franco Pavese
Author: Franco Pavese
Author: Emmanuil H Georgoulis