Author: J. Rettig
Publisher:
ISBN:
Category : Sequential analysis
Languages : en
Pages : 88

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Book Description

Author: J. Rettig
Publisher:
ISBN:
Category : Sequential analysis
Languages : en
Pages : 88

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Book Description

Author: Seong Yeon Choi
Publisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 240

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Book Description
In this thesis, the detection of permanent faults in sequential circuits by random testing is analyzed utilizing the circuit partitioning approach together with a continuous parameter Markov model. Given a large decomposable sequential circuit, it is partitioned into several smaller partitions using either serial or parallel decomposition. For each partition with certain stuck faults specified, the original state table and its error version are derived from an analysis of the partition under fault-free and faulty conditions, respectively. Then by simulation of these two tables on a computer, the parameters of the desired Markov model are obtained. For a specified degree of confidence, it is easy to derive the parameters of the Markov model and to calculate the required lengths of random test patterns.

Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category :
Languages : en
Pages : 92

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Book Description

Author: Richard Saeks
Publisher: Marcel Dekker
ISBN:
Category : Business & Economics
Languages : en
Pages : 264

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Book Description
Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.

Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022

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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Author: Arthur D. Friedman
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 252

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Book Description

Author: Marg Karpovsky
Publisher: Elsevier
ISBN: 032314442X
Category : Technology & Engineering
Languages : en
Pages : 619

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Book Description
Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.

Author: B. D. Carroll
Publisher:
ISBN:
Category :
Languages : en
Pages : 25

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Book Description
The research conducted on this project was concerned with the problem of test pattern generation for sequential logic circuits. More specifically, an algorithm was sought for generating test patterns for detecting single stuck-at faults in synchronous sequential circuits containing clocked flip-flop memory elements. In addition to the principal problem stated above, the related problems of test pattern generation for combinational iterative logic arrays and of test pattern generation for multiple faults in combinational logic circuits were also studied. A summary of the results obtained and the conclusions reached on the above problems is given. Suggestions for follow-on studies are discussed. Reprints of all papers published on the project are included in an appendix.

Author: Samiha Mourad
Publisher: Wiley-Interscience
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 450

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Book Description
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references