Author: Jean Hénoc
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 136
Book Description
A Rigorous Correction Procedure for Quantitative Electron Probe Microanalysis (COR 2)
Author: Jean Hénoc
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 136
Book Description
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 136
Book Description
A Century of Excellence in Measurements, Standards, and Technology
Author: David R. Lide
Publisher: CRC Press
ISBN: 1351077848
Category : Science
Languages : en
Pages : 396
Book Description
Established by Congress in 1901, the National Bureau of Standards (NBS), now the National Institute of Standards and Technology (NIST), has a long and distinguished history as the custodian and disseminator of the United States' standards of physical measurement. Having reached its centennial anniversary, the NBS/NIST reflects on and celebrates its first century with this book describing some of its seminal contributions to science and technology. Within these pages are 102 vignettes that describe some of the Institute's classic publications. Each vignette relates the context in which the publication appeared, its impact on science, technology, and the general public, and brief details about the lives and work of the authors. The groundbreaking works depicted include: A breakthrough paper on laser-cooling of atoms below the Doppler limit, which led to the award of the 1997 Nobel Prize for Physics to William D. Phillips The official report on the development of the radio proximity fuse, one of the most important new weapons of World War II The 1932 paper reporting the discovery of deuterium in experiments that led to Harold Urey's1934 Nobel Prize for Chemistry A review of the development of the SEAC, the first digital computer to employ stored programs and the first to process images in digital form The first paper demonstrating that parity is not conserved in nuclear physics, a result that shattered a fundamental concept of theoretical physics and led to a Nobel Prize for T. D. Lee and C. Y. Yang "Observation of Bose-Einstein Condensation in a Dilute Atomic Vapor," a 1995 paper that has already opened vast new areas of research A landmark contribution to the field of protein crystallography by Wlodawer and coworkers on the use of joint x-ray and neutron diffraction to determine the structure of proteins
Publisher: CRC Press
ISBN: 1351077848
Category : Science
Languages : en
Pages : 396
Book Description
Established by Congress in 1901, the National Bureau of Standards (NBS), now the National Institute of Standards and Technology (NIST), has a long and distinguished history as the custodian and disseminator of the United States' standards of physical measurement. Having reached its centennial anniversary, the NBS/NIST reflects on and celebrates its first century with this book describing some of its seminal contributions to science and technology. Within these pages are 102 vignettes that describe some of the Institute's classic publications. Each vignette relates the context in which the publication appeared, its impact on science, technology, and the general public, and brief details about the lives and work of the authors. The groundbreaking works depicted include: A breakthrough paper on laser-cooling of atoms below the Doppler limit, which led to the award of the 1997 Nobel Prize for Physics to William D. Phillips The official report on the development of the radio proximity fuse, one of the most important new weapons of World War II The 1932 paper reporting the discovery of deuterium in experiments that led to Harold Urey's1934 Nobel Prize for Chemistry A review of the development of the SEAC, the first digital computer to employ stored programs and the first to process images in digital form The first paper demonstrating that parity is not conserved in nuclear physics, a result that shattered a fundamental concept of theoretical physics and led to a Nobel Prize for T. D. Lee and C. Y. Yang "Observation of Bose-Einstein Condensation in a Dilute Atomic Vapor," a 1995 paper that has already opened vast new areas of research A landmark contribution to the field of protein crystallography by Wlodawer and coworkers on the use of joint x-ray and neutron diffraction to determine the structure of proteins
NIST Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 408
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 408
Book Description
Scanning Electron Microscopy
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135620
Category : Science
Languages : en
Pages : 476
Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of Münster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec tron beam can be blanked at high frequencies for time-resolving exper iments and what problems have tobe taken into account when focusing.
Publisher: Springer
ISBN: 3662135620
Category : Science
Languages : en
Pages : 476
Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of Münster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec tron beam can be blanked at high frequencies for time-resolving exper iments and what problems have tobe taken into account when focusing.
FRAME
Author: Harvey Yakowitz
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 56
Book Description
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 56
Book Description
NBS Technical Note
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 116
Book Description
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 116
Book Description
NASA Reference Publication
Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1 Citations and abstracts. v. 2. pt. 1. Key word index (A through L). v. 2. pt. 2. Key word index (M through Z)
Author: United States. National Bureau of Standards. Technical Information and Publications Division
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 804
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 804
Book Description
Frame C
Author: R. L. Myklebust
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 98
Book Description
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 98
Book Description
Publications
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 668
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 668
Book Description