Author: TASSO CollaborationPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
A Measurement of the Do Lifetime
Author: TASSO CollaborationRecombination Lifetime Measurements in Silicon
Author: Dinesh C. GuptaPublisher: ASTM International
ISBN: 0803124899
Category : Electronic measurements
Languages : en
Pages : 389
Book Description
Measurement of the Lifetimes of the Neutral and Charged D Mesons
Author: Larry Donnie GladneyPublisher:
ISBN:
Category :
Languages : en
Pages : 314
Book Description
Measurement of Carrier Lifetime in Semiconductors
Author: W. Murray BullisPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 68
Book Description
About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
The Recoil-distance Method for Nuclear Lifetime Measurement
Author: K. W. JonesLifetime Measurements of the First Excited States of B10 and Al28
Author: S. S. HannaA Measurement of the Average Lifetime of B Hadrons Using Vertex Reconstruction
Author: David Robert MullerPublisher:
ISBN:
Category : Hadrons
Languages : en
Pages : 486
Book Description
Excited State Lifetime Measurements
Author: J DemasPublisher: Elsevier
ISBN: 0323157548
Category : Science
Languages : en
Pages : 289
Book Description
Excited State Lifetime Measurements attempts to assist in clarifying and unifying the many characteristics and definitions of excited state lifetime measurements. The contents of this book are derived from a series of lectures presented to a research group in the University of New Mexico in 1967. The relevance as well as the methods and measurements of data treatment of excited state lifetimes are featured in this book. The first three chapters provide a brief discussion on concepts and applications of excited state lifetime measurements. Experimental methods and systems are also introduced in these chapters. Chapter 4 delves into more complex systems (serial decay kinetics and resonance energy transfer) while Chapter 5 focuses on the method of least squares fitting, its uses, and misuses. Chapters 6 to 8 mainly discuss the convolution integral and its different applications while Chapter 9 gives a more detailed presentation of instrumentation. The last two chapters discuss special errors and approaches to new methodologies regarding the study of the excited state lifetime measurements. The book will be useful to students and scientists including analytical chemists, photochemists, photobiologists, spectroscopists, and physicists.
Precise Measurement of the K+/K− and Π+/π− Lifetime Ratios
Author: F. LobkowiczPublisher:
ISBN:
Category : Hamiltonian operator
Languages : en
Pages : 16
Book Description
Carrier Lifetime Measurement by the Photoconductive Decay Method
Author: Richard L. MattisPublisher:
ISBN:
Category : Photoconductivity
Languages : en
Pages : 56
Book Description