A mass spectrometric study of secondary ion formation in hydrogen and deuterium PDF Download

Author: Inez June Ireland Delaney
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118916778
Category : Science
Languages : en
Pages : 412

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Book Description
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Author: Peter Robin Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages : 127

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Author: U. Lauterbach
Publisher:
ISBN:
Category : Deuterium
Languages : en
Pages : 36

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An automatic version of the R.P.D. (Retarding Potential Difference) method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD(+) ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr(+) + D2 yields KrD(+) + D the complementary reaction D2(+) + Kr yields KrD(+) + D contributes considerably to the KrD(+) yield. A rather small contribution of the neutral reaction Kr(*) + D2 yields KrD(+) + D + e( - ), found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2(*) + Kr yields KrD(+) + D + e( - ) by longlived exited states of D2 above the first ionization limit of D2.

Author: A. Benninghoven
Publisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 328

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Author: A. Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642822568
Category : Science
Languages : en
Pages : 518

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This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.

Author: J. C. Vickerman
Publisher: Oxford University Press, USA
ISBN:
Category : Business & Economics
Languages : en
Pages : 368

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Book Description
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.

Author: J. D. Waldron
Publisher: Elsevier
ISBN: 1483184412
Category : Science
Languages : en
Pages : 721

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Book Description
Advances in Mass Spectrometry documents the proceedings of a Joint Conference on Mass Spectrometry held at the University of London, Great Britain on September 24-26, 1958. This compilation reviews the instruments, techniques, applications, and major developments in mass spectrometry over the past years. The topics discussed include the performance and image error correction of the new stigmatic focusing mass spectrograph; correction of second order aberrations in inhomogeneous magnetic sector fields; and high sensitivity solid source mass spectrometry. The isotope dilution analysis; digitization of mass spectra; ionization potentials of alkyl and halogenated alkyl free radicals; and negative ion formation and electric breakdown in some halogenated gases are also elaborated. This book likewise covers the mass spectrometer as a geological instrument and absorption and desorption of gases in the ionized state on metal and glass surfaces. This publication is a useful reference to students and researchers conducting work on mass spectrometry.

Author: A. Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642881521
Category : Science
Languages : en
Pages : 455

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Book Description
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.

Author: Fred Stevie
Publisher: Momentum Press
ISBN: 1606505890
Category : Technology & Engineering
Languages : en
Pages : 233

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Book Description
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.