Author: Hongzhi LiPublisher:
ISBN:
Category : Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit
Languages : en
Pages : 172
Book Description
A BIST (built-in Self-test) Strategy for Mixed-signal Integrated Circuits
Author: Hongzhi LiPublisher:
ISBN:
Category : Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit
Languages : en
Pages : 172
Book Description
A Designer’s Guide to Built-In Self-Test
Author: Charles E. StroudPublisher: Springer
ISBN: 9781475776263
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Oscillation-Based Test in Mixed-Signal Circuits
Author: Gloria Huertas SánchezPublisher: Springer Science & Business Media
ISBN: 1402053150
Category : Technology & Engineering
Languages : en
Pages : 459
Book Description
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Author: Jose Luis Huertas DíazPublisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310
Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Author: Gordon W. RobertsPublisher: Springer Science & Business Media
ISBN: 1461523419
Category : Technology & Engineering
Languages : en
Pages : 125
Book Description
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Oscillation-Based Test in Mixed-Signal Circuits
Author: Gloria Huertas SánchezPublisher: Springer
ISBN: 9789048110681
Category : Technology & Engineering
Languages : en
Pages : 452
Book Description
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
A Designer’s Guide to Built-In Self-Test
Author: Charles E. StroudPublisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 338
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
A Designer's Guide to Built-in Self-Test
Author: Charles E. StroudPublisher: Springer Science & Business Media
ISBN: 1402070500
Category : Business & Economics
Languages : en
Pages : 338
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Author: Yichuang SunPublisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Built-in-self-test Techniques for Analog and Mixed Signal Circuits
Author: Jila ZakizadehPublisher:
ISBN:
Category : University of Ottawa theses
Languages : en
Pages : 158
Book Description