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Author: Harry Turtledove
Publisher: Baen Publishing Enterprises
ISBN: 1618244388
Category : Fiction
Languages : en
Pages : 482

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Book Description

Author: Amir Faghri
Publisher: Global Digital Press
ISBN: 0984276009
Category : Heat
Languages : en
Pages : 958

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Book Description
All relevant advanced heat and mass transfer topics in heat conduction, convection, radiation, and multi-phase transport phenomena, are covered in a single textbook, and are explained from a fundamental point of view.

Author: Jaya P. N. Bishwal
Publisher: Springer Nature
ISBN: 3031038614
Category : Mathematics
Languages : en
Pages : 634

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Book Description
This book develops alternative methods to estimate the unknown parameters in stochastic volatility models, offering a new approach to test model accuracy. While there is ample research to document stochastic differential equation models driven by Brownian motion based on discrete observations of the underlying diffusion process, these traditional methods often fail to estimate the unknown parameters in the unobserved volatility processes. This text studies the second order rate of weak convergence to normality to obtain refined inference results like confidence interval, as well as nontraditional continuous time stochastic volatility models driven by fractional Levy processes. By incorporating jumps and long memory into the volatility process, these new methods will help better predict option pricing and stock market crash risk. Some simulation algorithms for numerical experiments are provided.

Author:
Publisher:
ISBN:
Category : Germplasm resources, Plant
Languages : en
Pages : 994

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Book Description

Author: Erie County, N.Y. County Legislature
Publisher:
ISBN:
Category : Erie County (N.Y.)
Languages : en
Pages : 936

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Author: Erie County (N.Y.). Board of Supervisors
Publisher:
ISBN:
Category :
Languages : en
Pages : 778

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Author: Great Britain
Publisher:
ISBN:
Category : Great Britain
Languages : en
Pages : 1162

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Book Description

Author: M.D.Raisinghania
Publisher: S. Chand Publishing
ISBN: 8121928052
Category : Science
Languages : en
Pages : 519

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Book Description
Strictly according to the latest syllabus of U.G.C.for Degree level students and for various engineering and professional examinations such as GATE, C.S.I.R NET/JRFand SLET etc. For M.A./M.Sc (Mathematics) also.

Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 94

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Book Description

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128171839
Category : Technology & Engineering
Languages : en
Pages : 376

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Book Description
Advances in Imaging and Electron Physics, Volume 210 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing