Author: Shogo NakamuraPublisher:
ISBN:
Category : Electric discharges
Languages : en
Pages : 644
Book Description
34th International Field Emission Symposium
Author: Shogo NakamuraPublisher:
ISBN:
Category : Electric discharges
Languages : en
Pages : 644
Book Description
36th International Field Emission Symposium
Author: A. CerezoPublisher:
ISBN:
Category : Field emission
Languages : en
Pages : 596
Book Description
Atom Probe Tomography
Author: Michael K. MillerPublisher: Springer Science & Business Media
ISBN: 1461542812
Category : Technology & Engineering
Languages : en
Pages : 247
Book Description
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
33rd International Field Emission Symposium
Author: J. H. BlockPublisher:
ISBN:
Category : Field emission
Languages : en
Pages : 644
Book Description
Scientific Bulletin
Author: ONR Far East Scientific Bulletin
Author: Scientific and Technical Aerospace Reports
Author: Review
Author: Oak Ridge National LaboratoryPublisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 564
Book Description
Thirty-fourth International Symposium for Testing and Failure Analysis
Author: ASM InternationalPublisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551
Book Description
Atom Probe Microanalysis
Author: Michael Kenneth MillerPublisher:
ISBN:
Category : Science
Languages : en
Pages : 304
Book Description