Author: IEEE StaffPublisher:
ISBN: 9781665413350
Category :
Languages : en
Pages : 0
Book Description
With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc , global proliferation and cooperation is increasingly more important International Test Conference has been a flagship conference in test technology since 1970 With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, the 5th ITC Asia will be held in Shanghai China in 2021 and co located with China fault tolerant computing conference Attendee can involve themselves in not only the state of the art test technology trend, but also numerous industry hot topic forums organized by China Test Conference