2017 IEEE MTT S International Microwave Symposium (IMS) PDF Download
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Author: IEEE Staff Publisher: ISBN: 9781509063611 Category : Languages : en Pages :
Book Description
The IEEE MTT S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter wave, terahertz, and optical The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics
Author: IEEE Staff Publisher: ISBN: 9781509063611 Category : Languages : en Pages :
Book Description
The IEEE MTT S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter wave, terahertz, and optical The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics
Author: IEEE Staff Publisher: ISBN: 9781538650684 Category : Languages : en Pages :
Book Description
Microwave theory and techniques, RF microwave millimeter wave terahertz circuit design and fabrication technology, radio wireless communication
Author: International Microwave Symposium (Institute of Electrical and Electronics Engineers, 2004, Fort Worth, Tex.) Publisher: ISBN: Category : Microwave devices Languages : en Pages : 180
Author: International Microwave Symposium. Institute of Electrical and Electronics Engineers, 2004, Fort Worth, Tex.. Publisher: ISBN: Category : Languages : en Pages : 233
Author: IEEE Staff
Author: IEEE Staff
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Author: IEEE Staff
Author: International Microwave Symposium (Institute of Electrical and Electronics Engineers, 2004, Fort Worth, Tex.)
Author: 
Author: 
Author: International Microwave Symposium. Institute of Electrical and Electronics Engineers, 2004, Fort Worth, Tex..
Author: Institute of Electrical and Electronics Engineers