Author: Publisher:
ISBN: 9781479939312
Category : Integrated circuits
Languages : en
Pages :
Book Description
2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: Publisher:
ISBN: 9781479939312
Category : Integrated circuits
Languages : en
Pages :
Book Description
2014 21st IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2014)
Author: Institute of Electrical and Electronics Engineers (New York, NY)Publisher:
ISBN: 9781479939114
Category :
Languages : en
Pages : 389
Book Description
Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore
Author: 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: Publisher:
ISBN: 9781479939299
Category : Integrated circuits
Languages : en
Pages :
Book Description
Prognostics and Health Management of Electronics
Author: Michael G. PechtPublisher: John Wiley & Sons
ISBN: 1119515300
Category : Technology & Engineering
Languages : en
Pages : 809
Book Description
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
Electrical and Electronic Devices, Circuits, and Materials
Author: Suman Lata TripathiPublisher: John Wiley & Sons
ISBN: 1119755085
Category : Technology & Engineering
Languages : en
Pages : 608
Book Description
The increasing demand for electronic devices for private and industrial purposes lead designers and researchers to explore new electronic devices and circuits that can perform several tasks efficiently with low IC area and low power consumption. In addition, the increasing demand for portable devices intensifies the call from industry to design sensor elements, an efficient storage cell, and large capacity memory elements. Several industry-related issues have also forced a redesign of basic electronic components for certain specific applications. The researchers, designers, and students working in the area of electronic devices, circuits, and materials sometimesneed standard examples with certain specifications. This breakthrough work presents this knowledge of standard electronic device and circuit design analysis, including advanced technologies and materials. This outstanding new volume presents the basic concepts and fundamentals behind devices, circuits, and systems. It is a valuable reference for the veteran engineer and a learning tool for the student, the practicing engineer, or an engineer from another field crossing over into electrical engineering. It is a must-have for any library.
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
Author: Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the
Author: Institute of Electrical and Electronics EngineersPublisher:
ISBN: 9781424402069
Category :
Languages : en
Pages :
Book Description