Author: Publisher:
ISBN: 9781424455973
Category :
Languages : en
Pages : 364
Book Description
2010 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)
Author: ISTFA 2010
Author: Publisher: ASM International
ISBN: 1615037276
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author: Publisher: ASM International
ISBN: 1627080996
Category :
Languages : en
Pages :
Book Description
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: International Symposium on the Physical & Failure Analysis of Integrated CircuitsPublisher:
ISBN: 9780780377226
Category : Integrated circuits
Languages : en
Pages :
Book Description
ISTFA 2011
Author: Publisher: ASM International
ISBN: 1615038507
Category : Technology & Engineering
Languages : en
Pages : 479
Book Description
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author: Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages :
Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Publisher:
ISBN: 9781509095957
Category : Electronic books
Languages : en
Pages : 363
Book Description
ISTFA 2014
Author: A. S. M. InternationalPublisher: ASM International
ISBN: 1627080740
Category : Technology & Engineering
Languages : en
Pages : 561
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Souvik MahapatraPublisher: IEEE Computer Society Press
ISBN: 9781424410149
Category : Technology & Engineering
Languages : en
Pages : 309
Book Description