2006 IEEE International Test Conference PDF Download

Author: International Test Conference
Publisher:
ISBN:
Category :
Languages : en
Pages : 545

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Author:
Publisher:
ISBN: 9781424402915
Category :
Languages : en
Pages :

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Author: International Test Conference
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :

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Author: Mian Ahmad Jan
Publisher: Springer Nature
ISBN: 3031239474
Category : Computers
Languages : en
Pages : 682

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The three-volume set LNICST 465, 466 and 467 constitutes the proceedings of the Second EAI International Conference on Application of Big Data, Blockchain, and Internet of Things for Education Informatization, BigIoT-EDU 2022, held as virtual event, in July 29–31, 2022. The 204 papers presented in the proceedings were carefully reviewed and selected from 550 submissions. BigIoT-EDU aims to provide international cooperation and exchange platform for big data and information education experts, scholars and enterprise developers to share research results, discuss existing problems and challenges, and explore cutting-edge science and technology. The conference focuses on research fields such as “Big Data” and “Information Education. The use of Artificial Intelligence (AI), Blockchain and network security lies at the heart of this conference as we focused on these emerging technologies to excel the progress of Big Data and information education.

Author: Piotr Witczak
Publisher: MDPI
ISBN: 3036510486
Category : Technology & Engineering
Languages : en
Pages : 236

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Fault diagnosis has always been a concern for industry. In general, diagnosis in complex systems requires the acquisition of information from sensors and the processing and extracting of required features for the classification or identification of faults. Therefore, fault diagnosis of sensors is clearly important as faulty information from a sensor may lead to misleading conclusions about the whole system. As engineering systems grow in size and complexity, it becomes more and more important to diagnose faulty behavior before it can lead to total failure. In the light of above issues, this book is dedicated to trends and applications in modern-sensor fault diagnosis.

Author: Sergey Yurish
Publisher: Lulu.com
ISBN: 8469786334
Category : Technology & Engineering
Languages : en
Pages : 536

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The 1st volume of 'Advances in Microelectronics: Reviews' Book Series contains 19 chapters written by 72 authors from academia and industry from 16 countries. With unique combination of information in each volume, the 'Advances in Microelectronics: Reviews' Book Series will be of value for scientists and engineers in industry and at universities. In order to offer a fast and easy reading of the state of the art of each topic, every chapter in this book is independent and self-contained. All chapters have the same structure: first an introduction to specific topic under study; second particular field description including sensing applications. Each of chapter is ending by well selected list of references with books, journals, conference proceedings and web sites. This book ensures that readers will stay at the cutting edge of the field and get the right and effective start point and road map for the further researches and developments.

Author:
Publisher:
ISBN:
Category : Microwaves
Languages : en
Pages : 830

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Author: Patrick Girard
Publisher: Springer Science & Business Media
ISBN: 1441909281
Category : Technology & Engineering
Languages : en
Pages : 376

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Author: Carolina Metzler
Publisher: Springer Nature
ISBN: 3030532739
Category : Computers
Languages : en
Pages : 355

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This book contains extended and revised versions of the best papers presented at the 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019. The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.

Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 402

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