Author:
Publisher: IEEE
ISBN: 9780769512037
Category : Computers
Languages : en
Pages : 468

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Book Description
This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550

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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Author: Michael Nicolaidis
Publisher: Springer Science & Business Media
ISBN: 1441969934
Category : Technology & Engineering
Languages : en
Pages : 331

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Book Description
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Author:
Publisher: IEEE
ISBN: 9780769507194
Category : Computers
Languages : en
Pages : 422

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Book Description
This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

Author: Fernanda Lima Kastensmidt
Publisher: Springer Science & Business Media
ISBN: 038731069X
Category : Technology & Engineering
Languages : en
Pages : 193

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Book Description
This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

Author: Fernanda Kastensmidt
Publisher: Springer
ISBN: 3319143522
Category : Technology & Engineering
Languages : en
Pages : 319

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Book Description
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Author: Swee-Huay Heng
Publisher: Springer
ISBN: 3642176194
Category : Computers
Languages : en
Pages : 366

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Book Description
The 9th International Conference on Cryptology and Network Security (CANS 2010) was held in Kuala Lumpur, Malaysia during December 12–14, 2010. The conference was co-organized by the Multimedia University (MMU), Malaysia, and Universiti Tunku Abdul Rahman (UTAR), Malaysia. The conference received 64 submissions from 22 countries, out of which 21 were accepted after a careful and thorough review process. These proceedings also contain abstracts for two invited talks. All submissions were reviewed by at least three members of the Program Committee; those authored or co-authored by Program Committee members were reviewed by at least ?ve reviewers. P- gram Committee members were allowed to use external reviewers to assist with their reviews, but remained responsible for the contents of the review and r- resenting papers during the discussion and decision making. The review phase was followed by a 10-day discussion phase in which each paper with at least one supporting review was discussed, additional experts were consulted where needed, and ?nal decisions were made. We thank the Program Committee for their hard work in selecting the p- gram. We also thank the external reviewers who assisted with reviewing and the CANS Steering Committee for their help. We thank Shai Halevi for use of his Web-Submission-and-Review software that was used for the electronic s- mission and review of the submitted papers, and we thank the International Association for Cryptologic Research (IACR) for Web hosting of the software.

Author: Andrea Bondavalli
Publisher: Springer
ISBN: 331910506X
Category : Computers
Languages : en
Pages : 356

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Book Description
This book constitutes the refereed proceedings of the 33nd International Conference on Computer Safety, Reliability, and Security, SAFECOMP 2014, held in Florence, Italy, in September 2014. The 20 revised full papers presented together with 3 practical experience reports were carefully reviewed and selected from 85 submissions. The papers are organized in topical sections on fault injection techniques, verification and validation techniques, automotive systems, coverage models and mitigation techniques, assurance cases and arguments, system analysis, security and trust, notations/languages for safety related aspects, safety and security.

Author: Cristina Silvano
Publisher: Springer Nature
ISBN: 3031460774
Category : Computers
Languages : en
Pages : 504

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Book Description
This book constitutes the proceedings of the 22st International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, SAMOS 2021, which took place in July 2022 in Samos, Greece. The 11 full papers and 7 short papers presented in this volume were carefully reviewed and selected from 45 submissions. The conference covers a wide range of embedded systems design aspects, including machine learning accelerators, and power management and programmable dataflow systems.

Author: Zheng Wang
Publisher: Springer
ISBN: 9811010730
Category : Technology & Engineering
Languages : en
Pages : 197

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Book Description
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.