Author: IEEE, Press Staff
Publisher: IEEE
ISBN: 9780780365490
Category : Computers
Languages : en
Pages :
Book Description
International Test Conference 2000
Author: IEEE, Press Staff
Publisher: IEEE
ISBN: 9780780365490
Category : Computers
Languages : en
Pages :
Book Description
Publisher: IEEE
ISBN: 9780780365490
Category : Computers
Languages : en
Pages :
Book Description
2000 IEEE International Test Conference
Author:
Publisher:
ISBN: 9780780365476
Category : Electronic digital computers
Languages : en
Pages : 1158
Book Description
Publisher:
ISBN: 9780780365476
Category : Electronic digital computers
Languages : en
Pages : 1158
Book Description
2000 International Test Conference
Author: IEEE Computer Society Staff
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
International Test Conference 2000
2005 IEEE International Test Conference (ITC)
Author: International Test Conference
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
2007 IEEE International Test Conference
Author: Computer Society Test Technology Technical Council
Publisher:
ISBN:
Category :
Languages : en
Pages : 528
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 528
Book Description
Proceedings, 2016 IEEE International Test Conference (ITC)
2000 IEEE International Conference on Microelectronic Test Structures
Author: IEEE Electron Devices Society
Publisher: IEEE Standards Office
ISBN: 9780780362765
Category : Technology & Engineering
Languages : en
Pages : 251
Book Description
These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.
Publisher: IEEE Standards Office
ISBN: 9780780362765
Category : Technology & Engineering
Languages : en
Pages : 251
Book Description
These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.
Reliability, Availability and Serviceability of Networks-on-Chip
Author: Érika Cota
Publisher: Springer Science & Business Media
ISBN: 1461407915
Category : Technology & Engineering
Languages : en
Pages : 220
Book Description
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Publisher: Springer Science & Business Media
ISBN: 1461407915
Category : Technology & Engineering
Languages : en
Pages : 220
Book Description
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Advances in Electronic Testing
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 0387294090
Category : Technology & Engineering
Languages : en
Pages : 431
Book Description
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Publisher: Springer Science & Business Media
ISBN: 0387294090
Category : Technology & Engineering
Languages : en
Pages : 431
Book Description
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.