1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium PDF Download

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1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium

1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium PDF Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 312

Book Description
This volume features coverage of new developments in and applications relating to generation and removal of heat within semiconductor devices, and measurement of junction temperatures under various application and environmental conditions.

1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium

1997 IEEE 13th Annual Semiconductor Thermal Measurement & Management Symposium PDF Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 312

Book Description
This volume features coverage of new developments in and applications relating to generation and removal of heat within semiconductor devices, and measurement of junction temperatures under various application and environmental conditions.

Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium PDF Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 291

Book Description


Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148

Book Description


Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Annual IEEE Semiconductor Thermal Measurement and Management Symposium PDF Author:
Publisher:
ISBN:
Category : Amorphous semiconductors
Languages : en
Pages : 282

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 136

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Book Description


Silicon Microchannel Heat Sinks

Silicon Microchannel Heat Sinks PDF Author: Lian Zhang
Publisher: Springer Science & Business Media
ISBN: 3662098997
Category : Technology & Engineering
Languages : en
Pages : 148

Book Description
Two-phase microchannel cooling is one of the most promising thermal-management technologies for future high-power IC chips. Understanding the boiling process and the two-phase-flow behavior in microchannels is the key to successful implementation of a microchannel heat sink. This book focuses on the phase-change phenomena and the heat transfer in sub-150 nm diameter silicon microchannels, with emphasis on thermal measurement and modeling, and the impact of small dimensions on two-phase flow regimes.

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 160

Book Description


Publications in Engineering

Publications in Engineering PDF Author:
Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 748

Book Description